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1

FURTHER ASPECTS OF THE NEW ZEALAND DAIRY INDUSTRY

PROFESSOR W. RIDDET

Journal:

International Journal of Dairy Technology

Year:

1954

Language:

english

File:

PDF, 1.52 MB

english, 1954

2

Hierarchical Simulation of Statistical Variability: From 3-D MC With “ ab initio” Ionized Impurity Scattering to Statistical Compact Models

Kovac, U., Alexander, C., Roy, G., Riddet, C., Binjie Cheng, Asenov, A.

Journal:

IEEE Transactions on Electron Devices

Year:

2010

Language:

english

File:

PDF, 963 KB

english, 2010

3

SOME ASPECTS OF THE DAIRY INDUSTRY IN NEW ZEALAND

PROF. w. RIDDET

Journal:

International Journal of Dairy Technology

Year:

1953

Language:

english

File:

PDF, 745 KB

english, 1953

4

[IEEE 2014 International Workshop on Computational Electronics (IWCE) - Paris, France (2014.6.3-2014.6.6)] 2014 International Workshop on Computational Electronics (IWCE) - Metamorphosis of a nano wire: A 3-D coupled mode space NEGF study

Amoroso, Salvatore Maria, Georgiev, Vihar P., Towie, Ewan, Riddet, Craig, Asenov, Asen

Year:

2014

Language:

english

File:

PDF, 3.36 MB

english, 2014

5

[IEEE Electrical Performance of Electronic Packaging - Austin, TX (2004.10.27-2004.10.27)] Electrical Performance of Electronic Packaging IWCE-04 - Scattering from body thickness fluctuations in double gate MOSFETs: an ab initio Monte Carlo simulation study

Riddet,, Brow,, Alexander,, Watling,, Roy,, Asenov,

Year:

2004

Language:

english

File:

PDF, 140 KB

english, 2004

6

[IEEE 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Washington DC, USA (2015.9.9-2015.9.11)] 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Multi-Subband Ensemble Monte Carlo simulation of Si nanowire MOSFETs

Donetti, Luca, Sampedro, Carlos, Gamiz, Francisco, Godoy, Andres, Garcia-Ruiz, Francisco J., Towiez, Ewan, Georgiev, Vihar P., Amoroso, Salvatore Maria, Riddet, Craig, Asenov, Asen

Year:

2015

Language:

english

File:

PDF, 963 KB

english, 2015

7

Simulation of hole-mobility in doped relaxed and strained Ge

Jeremy R. Watling, Craig Riddet, Kah H. Chan, Asen Asenov

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 472 KB

english, 2011

8

Simulation study of the 20 nm gate-length Ge implant-free quantum well p-MOSFET

K.H. Chan, B. Benbakhti, C. Riddet, J.R. Watling, A. Asenov

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 630 KB

english, 2011

9

Numerical analysis of the new Implant-Free Quantum-Well CMOS: DualLogic approach

Brahim Benbakhti, KahHou Chan, Ewan Towie, Karol Kalna, Craig Riddet, Xingsheng Wang, Geert Eneman, Geert Hellings, Kristin De Meyer, Marc Meuris, Asen Asenov

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 961 KB

english, 2011

10

Scattering from Body Thickness Fluctuations in Double Gate MOSFETs: Anab initioMonte Carlo Simulation Study

C. Riddet, A. R. Brown, C. Alexander, J. R. Watling, S. Roy, A. Asenov

Journal:

Journal of Computational Electronics

Year:

2004

Language:

english

File:

PDF, 539 KB

english, 2004

11

Boundary conditions for Density Gradient corrections in

Craig Riddet, Andrew R. Brown, Scott Roy, Asen Asenov

Journal:

Journal of Computational Electronics

Year:

2008

Language:

english

File:

PDF, 522 KB

english, 2008

12

Simulation of statistical variability in nano-CMOS transistors using drift-diffusion, Monte Carlo and non-equilibrium Green’s function techniques

Asen Asenov, Andrew R. Brown, Gareth Roy, Binjie Cheng, Craig Alexander, Craig Riddet, Urban Kovac, Antonio Martinez, Natalia Seoane, Scott Roy

Journal:

Journal of Computational Electronics

Year:

2009

Language:

english

File:

PDF, 5.47 MB

english, 2009

13

Use of density gradient quantum corrections in the simulation of

Andrew R. Brown, Jeremy R. Watling, Gareth Roy, Craig Riddet, Craig L. Alexander, Urban Kovac, Antonio Martinez, Asen Asenov

Journal:

Journal of Computational Electronics

Year:

2010

Language:

english

File:

PDF, 1.04 MB

english, 2010

14

Simulation of “Ab Initio” Quantum Confinement Scattering in UTB MOSFETs Using Three-Dimensional Ensemble Monte Carlo

Riddet, C., Alexander, C., Brown, A.R., Roy, S., Asenov, A.

Journal:

IEEE Transactions on Electron Devices

Year:

2011

Language:

english

File:

PDF, 896 KB

english, 2011

15

Hole Mobility in Germanium as a Function of Substrate and Channel Orientation, Strain, Doping, and Temperature

Riddet, C., Watling, J.R., Chan, K., Parker, E.H.C., Whall, T.E., Leadley, D.R., Asenov, A.

Journal:

IEEE Transactions on Electron Devices

Year:

2012

Language:

english

File:

PDF, 848 KB

english, 2012

16

[IEEE 2008 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2008) - Hakone-Machi, Kanagawa (2008.09.9-2008.09.11)] 2008 International Conference on Simulation of Semiconductor Processes and Devices - Convergence properties of density gradient quantum corrections in 3D ensemble Monte Carlo Simulations

Riddet, Craig, Asenov, Asen

Year:

2008

Language:

english

File:

PDF, 1019 KB

english, 2008

17

[IEEE 2013 14th International Conference on Ultimate Integration on Silicon (ULIS 2013) - Coventry (2013.3.19-2013.3.21)] 2013 14th International Conference on Ultimate Integration on Silicon (ULIS) - Monte carlo simulation of the effect of interface roughness in Implant-Free Quantum-Well MOSFETs

Towie, E. A., Riddet, C., Asenov, A.

Year:

2013

Language:

english

File:

PDF, 1.42 MB

english, 2013

18

[IEEE 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Glasgow, United Kingdom (2013.09.3-2013.09.5)] 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Comparison of raised source/drain Implant-Free Quantum-Well and Tri-gate MOSFETs using 3D Monte Carlo simulation

Towie, Ewan A., Riddet, Craig, Asenov, Asen

Year:

2013

Language:

english

File:

PDF, 3.62 MB

english, 2013

19

[IEEE 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Yokohama, Japan (2014.9.9-2014.9.11)] 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - 3D multi-subband ensemble Monte Carlo simulator of FinFETs and nanowire transistors

Sampedro, C., Donetti, L., Gamiz, F., Godoy, A., Garcia-Ruiz, F. J., Georgiev, V. P., Amoroso, S. M., Riddet, C., Towie, E. A., Asenov, A.

Year:

2014

Language:

english

File:

PDF, 2.98 MB

english, 2014

20

[IEEE 2013 14th International Conference on Ultimate Integration on Silicon (ULIS 2013) - Coventry (2013.3.19-2013.3.21)] 2013 14th International Conference on Ultimate Integration on Silicon (ULIS) - Impact of the statistical variability on 15nm III–V and Ge MOSFET based SRAM design

Si-Yu Liao,, Towie, E. A., Balaz, D., Riddet, C., Cheng, B., Asenov, A.

Year:

2013

Language:

english

File:

PDF, 1.35 MB

english, 2013

21

[IEEE 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Glasgow, United Kingdom (2013.09.3-2013.09.5)] 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - PDK development for 10nm III-V/Ge IFQW CMOS technology including statistical variability

Liao, Si-Yu, Towie, Ewan A., Balaz, Daniel, Riddet, Craig, Cheng, Binjie, Asenov, Asen

Year:

2013

Language:

english

File:

PDF, 4.28 MB

english, 2013

22

[IEEE 2010 International Workshop on Computational Electronics (IWCE) - Pisa, Italy (2010.10.26-2010.10.29)] 2010 14th International Workshop on Computational Electronics - Monte Carlo simulation study of hole mobility in germanium MOS inversion layers

Riddet, C., Watling, J. R., Chan, K. H., Asenov, A., De Jaeger, Brice, Mitard, Jerome, Meuris, Marc

Year:

2010

Language:

english

File:

PDF, 854 KB

english, 2010

23

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Advanced simulation of statistical variability and reliability in nano CMOS transistors

Asenov, A., Roy, S., Brown, R. A., Roy, G., Alexander, C., Riddet, C., Millar, C., Cheng, B., Martinez, A., Seoane, N., Reid, D., Bukhori, M. F., Wang, X., Kovac, U.

Year:

2008

Language:

english

File:

PDF, 1.18 MB

english, 2008

24

Performance and Variability of Doped Multithreshold FinFETs for 10-nm CMOS

Adamu-Lema, Fikru, Wang, Xingsheng, Amoroso, Salvatore Maria, Riddet, Craig, Cheng, Binjie, Shifren, Lucian, Aitken, Robert, Sinha, Saurahb, Yeric, Greg, Asenov, Asen

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.61 MB

english, 2014

25

[IEEE 2012 15th International Workshop on Computational Electronics (IWCE) - Madison, WI, USA (2012.05.22-2012.05.25)] 2012 15th International Workshop on Computational Electronics - Accurate and efficient modelling of inelastic hole-acoustic phonon scattering in Monte Carlo simulations

Watling, J. R., Riddet, C., Asenov, A.

Year:

2012

Language:

english

File:

PDF, 292 KB

english, 2012

26

Simulation of hole-mobility in doped relaxed and strained Ge layers

Watling, Jeremy R., Riddet, Craig, Chan, Morgan Kah H., Asenov, Asen

Journal:

Journal of Applied Physics

Year:

2010

Language:

english

File:

PDF, 872 KB

english, 2010

27

3-D Monte Carlo Simulation of the Impact of Quantum Confinement Scattering on the Magnitude of Current Fluctuations in Double Gate MOSFETs

Riddet, Craig, Brown, Andrew R., Alexander, Craig L., Watling, Jeremy R., Roy, Scott, Asenov, Asen

Journal:

IEEE Transactions on Nanotechnology

Year:

2007

Language:

english

File:

PDF, 1.45 MB

english, 2007

28

[IEEE 2011 12th International Conference on Ultimate Integration on Silicon (ULIS) - Cork, Ireland (2011.03.14-2011.03.16)] Ulis 2011 Ultimate Integration on Silicon - Monte Carlo simulation of a 20 nm gate length implant free quantum well Ge pMOSFET with different lateral spacer width

Chan, KahHou, Benbakhti, Brahim, Riddet, Craig, Watling, Jeremy, Asenov, Asen

Year:

2011

Language:

english

File:

PDF, 816 KB

english, 2011

29

[IEEE 2012 International Silicon-Germanium Technology and Device Meeting (ISTDM) - Berkeley, CA, USA (2012.06.4-2012.06.6)] 2012 International Silicon-Germanium Technology and Device Meeting (ISTDM) - Monte Carlo Simulations of Ge Implant Free Quantum Well FETs - The Role of Substrate and Channel Orientation

Chan, Kah Hou, Riddet, Craig, Watling, Jeremy R., Asenov, Asen

Year:

2012

Language:

english

File:

PDF, 205 KB

english, 2012

30

[IEEE 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Glasgow, United Kingdom (2013.09.3-2013.09.5)] 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Performance evaluation of p-channel FinFETs using 3D ensemble Monte Carlo simulation

Riddet, Craig, Towie, Ewan A., Asenov, Asen

Year:

2013

Language:

english

File:

PDF, 742 KB

english, 2013

31

[IEEE 2015 16th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2015.3.2-2015.3.4)] Sixteenth International Symposium on Quality Electronic Design - Circuit design perspectives for Ge FinFET at 10nm and beyond

Sinha, S., Shifren, L., Chandra, V., Cline, B., Yeric, G., Aitken, R., Cheng, B., Brown, A.R., Riddet, C., Alexandar, C., Millar, C., Asenov, A.

Year:

2015

Language:

english

File:

PDF, 1005 KB

english, 2015

32

Inverse Scaling Trends for Charge-Trapping-Induced Degradation of FinFETs Performance

Amoroso, Salvatore Maria, Georgiev, Vihar P., Gerrer, Louis, Towie, Ewan, Wang, Xingsheng, Riddet, Craig, Brown, Andrew Robert, Asenov, Asen

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.05 MB

english, 2014

33

[ACM Press the 50th Annual Design Automation Conference - Austin, Texas (2013.05.29-2013.06.07)] Proceedings of the 50th Annual Design Automation Conference on - DAC '13 - Predicting future technology performance

Asenov, Asen, Alexander, Craig, Riddet, Craig, Towie, Ewan

Year:

2013

Language:

english

File:

PDF, 669 KB

english, 2013

34

Simulation Study of the Impact of Quantum Confinement on the Electrostatically Driven Performance of n-type Nanowire Transistors

Wang, Yijiao, Al-Ameri, Talib, Wang, Xingsheng, Georgiev, Vihar P., Towie, Ewan, Amoroso, Salvatore Maria, Brown, Andrew R., Cheng, Binjie, Reid, David, Riddet, Craig, Shifren, Lucian, Sinha, Saurabh,

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 4.87 MB

english, 2015

35

Fat oxidation in Cheddar cheese

Riddet, W., Whitehead, H. R., Robertson, P. S., Harkness, W. L.

Journal:

Journal Dairy Research

Year:

1961

Language:

english

File:

PDF, 923 KB

english, 1961

36

267. Studies on the chemistry of Cheddar cheesemaking VII. The measurement of the acidity of cheese and the relation of acidity to grading score

Dolby, R. M., McDowall, F. H., Riddet, W.

Journal:

Journal Dairy Research

Year:

1940

Language:

english

File:

PDF, 293 KB

english, 1940

37

[IEEE 2014 IEEE 12th International Conference on Solid -State and Integrated Circuit Technology (ICSICT) - Guilin, China (2014.10.28-2014.10.31)] 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Predictive simulation of future CMOS technologies and their impact on circuits

Asenov, A., Cheng, B., Adamu-Lema, F., Shifren, L., Sinha, S., Riddet, C., Alexander, C., Brown, A. R., Wang, X., Amoroso, S. M.

Year:

2014

Language:

english

File:

PDF, 1.28 MB

english, 2014

38

[Society of Petroleum Engineers Middle East Oil Technical Conference and Exhibition - Bahrain (1985-03-11)] Middle East Oil Technical Conference and Exhibition - Artificial Lift by Hydraulic Turbine Driven Downhole Pumps

Riddet, David A.

Language:

english

File:

PDF, 664 KB

english

39

[Society of Petroleum Engineers Middle East Oil Technical Conference and Exhibition - (1985.03.11-1985.03.14)] Proceedings of Middle East Oil Technical Conference and Exhibition - Artificial Lift by Hydraulic Turbine Driven Downhole Pumps

Year:

1985

Language:

english

File:

PDF, 664 KB

english, 1985

40

Monte Carlo simulation study of the impact of strain and substrate orientation on hole mobility in Germanium

Riddet, Craig, Watling, Jeremy R, Chan, KahHou, Asenov, Asen

Journal:

Journal of Physics Conference Series

Year:

2010

Language:

english

File:

PDF, 874 KB

english, 2010

41

[IEEE 2016 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2016.6.14-2016.6.16)] 2016 IEEE Symposium on VLSI Technology - Variability-aware TCAD based design-technology co-optimization platform for 7nm node nanowire and beyond

Wang, Y., Cheng, B., Wang, X., Towie, E., Riddet, C., Brown, A. R., Amoroso, S. M., Wang, L., Reid, D., Liu, X., Kang, J., Asenov, A.

Year:

2016

Language:

english

File:

PDF, 1.73 MB

english, 2016

42

[IEEE 2016 IEEE Nanotechnology Materials and Devices Conference (NMDC) - Toulouse, France (2016.10.9-2016.10.12)] 2016 IEEE Nanotechnology Materials and Devices Conference (NMDC) - Experimental and simulation study of a high current 1D silicon nanowire transistor using heavily doped channels

Georgiev, Vihar P., Mirza, Muhammad M., Dochioiu, Alexandru-Iustin, Lema, Fikru-Adamu, Amoroso, Slavatore M., Towie, Ewan, Riddet, Craig, MacLaren, Donald A., Asenov, Asen, Paul, Douglas J.

Year:

2016

Language:

english

File:

PDF, 647 KB

english, 2016

43

[IEEE 2016 IEEE Nanotechnology Materials and Devices Conference (NMDC) - Toulouse, France (2016.10.9-2016.10.12)] 2016 IEEE Nanotechnology Materials and Devices Conference (NMDC) - Performance of vertically stacked horizontal Si nanowires transistors: A 3D Monte Carlo/2D Poisson Schrodinger simulation study

Al-Ameri, Talib, Georgiev, V. P., Lema, F. Adamu, Sadi, T., Towie, E., Riddet, C., Alexander, C., Asenov, A.

Year:

2016

File:

PDF, 413 KB

2016

44

Experimental and simulation study of 1D silicon nanowire transistors using heavily doped channels

Georgiev, Vihar P., Mirza, Muhammad, Dochioiu, Alexandru-Iustin, Adamu-Lema, Fikru, Amoroso, Salvatore M., Towie, Ewan, Riddet, Craig, MacLaren, Donald A., Asenov, Asen, Paul, Douglas J.

Journal:

IEEE Transactions on Nanotechnology

Year:

2017

Language:

english

File:

PDF, 4.86 MB

english, 2017

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